Institute of Microelectronic Systems Research
KIBI - AI-based surface inspection & automated damage detection for automotive assessment

KIBI - AI-based surface inspection & automated damage detection for automotive assessment

Led by:  Prof. Dr.-Ing. Holger Blume
E-Mail:  langhorst@ims.uni-hannover.de
Team:  D. Langhorst
Year:  2025
Date:  12-03-25
Funding:  Europäischen Fonds für regionale Entwicklung (EFRE), Land Niedersachsen
Duration:  2025-2027