Formally Verifying Analog Neural Networks with Device Mismatch Variations

Verfasst von

Yasmine Abu-Haeyeh, Thomas Bartelsmeier, Tobias Ladner, Matthias Althoff, Lars Hedrich, Markus Olbrich

Abstract

Training and running inference of large neural networks comes with excessive cost and power consumption. Thus, realizing these networks as analog circuits is an energy-and areaefficient alternative. However, analog neural networks suffer from inherent deviations within their circuits, requiring extensive testing for their correct behavior under these deviations. Unfortunately, tests based on Monte Carlo simulations are extremely time- and resource-intensive. We present an alternative approach to proving the correctness of the neural network using formal neural network verification techniques and developing a modeling methodology for these analog neural circuits. Our experimental results compare two methods based on reachability analysis showing their effectiveness by reducing the test time from days to milliseconds. Thus, they offer a faster, more scalable solution for verifying the correctness of analog neural circuits.

Details

Organisationseinheit(en)
Fachgebiet Mixed-Signal-Schaltungen
Externe Organisation(en)
Goethe-Universität Frankfurt am Main
Technische Universität München (TUM)
Typ
Aufsatz in Konferenzband
Publikationsdatum
31.03.2025
Publikationsstatus
Veröffentlicht
Peer-reviewed
Ja
ASJC Scopus Sachgebiete
Allgemeiner Maschinenbau
Elektronische Version(en)
https://doi.org/10.23919/DATE64628.2025.10992891 (Zugang: Geschlossen )