Automated Abstraction of Nonlinear Analog Circuits to Reliable Set-Valued Models with Reduced Overapproximation
- authored by
- Malgorzata Rechmal-Lesse, Yeremia Gunawan Adhisantoso, Gerald Alexander Koroa, Markus Olbrich
- Abstract
This paper tackles the analog and mixed-signal modeling for verification challenges. It proposes an adjustable automated modeling approach, which provides set-valued models with reduced overapproximation. The models reliably enclose parameter variations and modeling errors. The reduced overapproximation is obtained by computing the intersecting set of models with intervals and affine forms. The nonlinear circuit examples show a reduced overapproximation up to 86%.
- Organisation(s)
-
Institute of Microelectronic Systems
- Type
- Article
- Journal
- Microelectronics Reliability
- Volume
- 121
- ISSN
- 0026-2714
- Publication date
- 06.2021
- Publication status
- Published
- Peer reviewed
- Yes
- ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Safety, Risk, Reliability and Quality, Surfaces, Coatings and Films, Electrical and Electronic Engineering
- Electronic version(s)
-
https://doi.org/10.1016/j.microrel.2021.114119 (Access:
Closed)
