Novel metrics for Analog Mixed-Signal coverage

authored by

Andreas Fürtig, Georg Gläser, Christoph Grimm, Lars Hedrich, Stefan Heinen, Hyun-Sek Lukas Lee, Gregor Nitsche, Markus Olbrich, Carna Radojicic, Fabian Speicher

Abstract

On the contrary to the digital world, no coverage definition exists in the Analog/Mixed-Signal (AMS) context. As digital coverage helps digital designers and verification engineers to evaluate their verification progress, analog designers do not have such metrics. This paper proposes a set of different analog coverage metrics, which improve the confidence in AMS circuit verification. We will demonstrate, that no single overall coverage metric exists. However, as with digital coverage, the proposed analog coverage metrics could substantially help in rating the verification process. Illustrated by a complex AMS circuit example we will explore the limits of analog coverage methodologies as well as the benefits on different levels of abstraction ranging from transistor level up to system level.

Organisation(s)

Mixed-Signal Circuits Section

Type

Conference contribution

Pages

97-102

No. of pages

6

Publication date

2017

Publication status

Published

Peer reviewed

Yes

Electronic version(s)

https://doi.org/10.1109/DDECS.2017.7934589 (Access: Closed)