Robustness measurement of integrated circuits and its adaptation to aging effects.

authored by

Martin Barke, Michael Kärgel, Markus Olbrich, Ulf Schlichtmann

Organisation(s)

Mixed-Signal Circuits Section

Type

Article

Journal

Microelectron. Reliab.

Volume

54

Pages

1058-1065

Publication date

2014

Publication status

Published

Peer reviewed

Yes

Electronic version(s)

https://doi.org/10.1016/J.MICROREL.2014.01.012 (Access: Unknown)