Experimental Radiation Effect Characterization for Microelectronics

authored by

Eike Trumann, Gia Bao Thieu, Guillermo Pava Vaya, Kirsten Weide-Zaage

Abstract

In the process of developing high-reliability microelectronics, experimental radiation testing plays a vital role in assuring the durability and correct functionality of the device. As three major classes of radiation effects affect components, different radiation qualification tests must be combined to give comprehensive radiation hardness assurance. This work provides an overview of radiation testing standards, radiation sources, and important considerations for radiation testing.

Organisation(s)

Institute of Microelectronic Systems

External Organisation(s)

Technische Universität Braunschweig

Type

Conference contribution

Publication date

27.01.2025

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Safety, Risk, Reliability and Quality, Electronic, Optical and Magnetic Materials, Instrumentation

Electronic version(s)

https://doi.org/10.23919/PanPacific65826.2025.10908937 (Access: Closed)